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TS150, TS200 & TS300
TS150-THZ Probe System
TS150-AIT & TS200-THZ
TS200-SE Probe System
TS300-IFE/TS300-SE Probe System
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TS2000 Probe Systems
TS2000-IFE THZ Selection
TS2000-SE Probe System
TS3000/TS3000-IFE Probe System
TS3000-SE Probe System
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TS150-HP & TS200-HP
TS2000-DP Probe System
TS2000-HP Probe System
TS3000-HP Probe System
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TS2000-IFE Probe Systems Series
TS2500 Probe Systems Series
TS3500 Probe Systems Series
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ATMT™
NoiseShield™
Chuck Systems
MicroPositioners
DC & RF Probe Arms
Optics
Laser Cutter
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RF Probes & Accessories
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TITAN™ Multi-Contact Probes
RF Calibration Substrates
QAlibria®
RF Accessories
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Device Characterization
High Power
RF and mmW
Design Validation
Failure Analysis
Wafer Level Reliability
Silicon Photonics
MEMS Test
Signal Integrity
Test Systems
HV Isolog
High Power Complete System
HVC Switch - Automated High Power switching
VPL 3100 - Voltage Protection & Limiter Unit
PIV 1002 - MOSFET Designer-Tool
Ultra Fast Dynamic RDS(ON)
Pintester - a complete test environment
ResLog - Test system for current-carrying capacity and reliability tests
Software
Products
VC20E™ Lab
Indexer™
Diagnostic VersaCore™
VC43™/VC43EAF™
T40™
Minitile™ and WedgeTile™
T90™ Series Probe Card
Patch Panels
VersaTile™
Cryogenic Probe Cards
High Performance Cables and Accessories
ButtonTile™
Adjustable Multisite Rail System™
Tile-on-Card™
Production Wafer Level Burn-in
3KV High Voltage Test
Cryogenic Applications
Multisite Testing – Rail System
Products
Impedance Tuners
Fundamental Tuners 0.1-120 GHz
Harmonic Tuners 0.2-120 GHz
Waveguide Tuners 8-330 GHz
Low Frequency Tuners 1.5-170 MHz
Manual Wideband Tuners 0.4-18 GHz
Active Load Pull System
DLP Active Load Pull 0.5-40 GHz
Rapid VT Modulated Active Load Pull 0.5-40 GHz
Rapid DT (Digital Tuner) 0.001-18 GHz
Pulsed IV System
Auriga Standard PIV 220V & 600V
Auriga High Voltage PIV 1200V & 2000V
Auriga TRI-STATE PIV 220V
Focus MPIV 200V
Device Modelling
Compact Modelling
Behavioral Modelling
System Accessories
Bias Tees 0.1-67 GHz
Bi-Directional Couplers 5-120 GHz
Phase Stable Cables DC-110 GHz
TRL Calibration Kits 0.3-110 GHz
RF Test Fixtures DC-26 GHz
Phase Reference 0.1-67 GHz
Pulse Modulator DC-50 GHz
Noise Measurement System Up to 170 GHz
Power Amplifiers 0.1-170 GHz
Applications
Load Pull
Scalar Load Pull
Vector Load Pull
120 GHz Harmonic Load Pull
Sub-THz Vector Load Pull
Active Load Pull
Hybrid Active Load Pull
Time-Domain Load Pull
Ruggedness
Ruggedness Testing
Noise Measurements
2-67 GHz Noise Parameter System
D-Band Noise Parameter System
W-Band Noise Parameter System
Pulsed IV Systems
Pulsed Load Pull
Pulsed IV & S-Parameters
Device Modelling
Compact Modelling
Behavioral Modelling
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About Us
MPI Probing Solutions
Engineering Probe Systems
MPI Education Program
TS50 Probe Systems
IMPACT™ Test Solutions
MPI PCB Probe Systems
TS300-PCB – Probe System
TS600-PCB – Probe System
MPI Manual Probe Systems
TS150, TS200 & TS300
TS150-THZ Probe System
TS150-AIT & TS200-THZ
TS200-SE Probe System
TS300-IFE/TS300-SE Probe System
MPI Automated Systems
TS2000 Probe Systems
TS2000-IFE THZ Selection
TS2000-SE Probe System
TS3000/TS3000-IFE Probe System
TS3000-SE Probe System
MPI SiPH Probe Systems
MPI High Power Systems
TS150-HP & TS200-HP
TS2000-DP Probe System
TS2000-HP Probe System
TS3000-HP Probe System
MPI Fully Automated Systems
TS2000-IFE Probe Systems Series
TS2500 Probe Systems Series
TS3500 Probe Systems Series
MPI SENTIO® Software Suite
MPI Technologies & Accessories
ATMT™
NoiseShield™
Chuck Systems
MicroPositioners
DC & RF Probe Arms
Optics
Laser Cutter
Further Accessories
RF Probes & Accessories
TITAN™ Probe Technologies
TITAN™ Multi-Contact Probes
RF Calibration Substrates
QAlibria®
RF Accessories
Applications
Device Characterization
High Power
RF and mmW
Design Validation
Failure Analysis
Wafer Level Reliability
Silicon Photonics
MEMS Test
Signal Integrity
ATV Systems
Test Systems
HV Isolog
High Power Complete System
HVC Switch - Automated High Power switching
VPL 3100 - Voltage Protection & Limiter Unit
PIV 1002 - MOSFET Designer-Tool
Ultra Fast Dynamic RDS(ON)
Pintester - a complete test environment
ResLog - Test system for current-carrying capacity and reliability tests
Software
Celadon Systems
Products
VC20E™ Lab
Indexer™
Diagnostic VersaCore™
VC43™/VC43EAF™
T40™
Minitile™ and WedgeTile™
T90™ Series Probe Card
Patch Panels
VersaTile™
Cryogenic Probe Cards
High Performance Cables and Accessories
ButtonTile™
Adjustable Multisite Rail System™
Tile-on-Card™
Production Wafer Level Burn-in
3KV High Voltage Test
Cryogenic Applications
Multisite Testing – Rail System
Focus Microwaves
Products
Impedance Tuners
Fundamental Tuners 0.1-120 GHz
Harmonic Tuners 0.2-120 GHz
Waveguide Tuners 8-330 GHz
Low Frequency Tuners 1.5-170 MHz
Manual Wideband Tuners 0.4-18 GHz
Active Load Pull System
DLP Active Load Pull 0.5-40 GHz
Rapid VT Modulated Active Load Pull 0.5-40 GHz
Rapid DT (Digital Tuner) 0.001-18 GHz
Pulsed IV System
Auriga Standard PIV 220V & 600V
Auriga High Voltage PIV 1200V & 2000V
Auriga TRI-STATE PIV 220V
Focus MPIV 200V
Device Modelling
Compact Modelling
Behavioral Modelling
System Accessories
Bias Tees 0.1-67 GHz
Bi-Directional Couplers 5-120 GHz
Phase Stable Cables DC-110 GHz
TRL Calibration Kits 0.3-110 GHz
RF Test Fixtures DC-26 GHz
Phase Reference 0.1-67 GHz
Pulse Modulator DC-50 GHz
Noise Measurement System Up to 170 GHz
Power Amplifiers 0.1-170 GHz
Applications
Load Pull
Scalar Load Pull
Vector Load Pull
120 GHz Harmonic Load Pull
Sub-THz Vector Load Pull
Active Load Pull
Hybrid Active Load Pull
Time-Domain Load Pull
Ruggedness
Ruggedness Testing
Noise Measurements
2-67 GHz Noise Parameter System
D-Band Noise Parameter System
W-Band Noise Parameter System
Pulsed IV Systems
Pulsed Load Pull
Pulsed IV & S-Parameters
Device Modelling
Compact Modelling
Behavioral Modelling
News
Contacts
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