Optimize high power non-linear devices with Pulsed Load Pull. Characterize devices at peak power levels, reduce self-heating risks, and achieve precise thermal control for realistic operation in demanding applications like RADARs.
Features
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The use of pulsed stimulus signals in characterizing high-power non-linear devices offers several advantages over continuous wave excitation. Continuous wave excitation can lead to issues such as self-heating and memory effects which can severely impact device performance. By employing pulsed signals, devices can be characterized at higher peak power levels up to saturation, mimicking real-world operating conditions more accurately while reducing the risk of device breakdown and providing better control over operating temperature.
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Pulsed stimulus signals are particularly beneficial for applications such as RADARs where device operation in pulses is more common and representative of actual usage scenarios.
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Pulsed measurements, including pulsed I-V and pulsed S-parameter measurements, are widely utilized for extracting electrothermal models of different device technologies. This approach enables a more comprehensive understanding of device behavior under dynamic conditions, accounting for thermal and trapping effects.
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In pulsed load pull measurements, both DC and RF signals can be pulsed to assess device performance accurately. A typical pulsed load pull test bench consists of pulsed bias tees, a primary DC pulse generator, RF sources synchronized to a pulse generator, and a digitizing scope for monitoring pulsed DC characteristics. Focus LP utilizes pulse generators such as AU5 or MPIV to generate the required pulsed signals, ensuring accurate and reliable measurements.
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For RF characterization, two main scenarios are employed:
1. Scalar Load Pull: Peak power meters synchronized with the primary pulsing instrument are used to monitor RF power levels within the pulses.
2. Vector Load Pull: Measurements are conducted using Vector Network Analyzer receivers synchronized with the primary pulsing instrument, providing detailed RF data within the pulsed signals. -
Overall, pulsed measurements offer a valuable and versatile approach for accurately characterizing high-power non-linear devices, extracting device models, and testing devices under realistic operating conditions with minimized risks of self-heating and breakdown.
Setup
