The 20mm VC20™ with Advanced Cantilever™ technology is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms.
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- 20 millimeter ceramic probe card
- Optimized for DC parametric test, modeling and characterization, and single site WLR
- Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
- Effective operating temperature range from -65° to 200° C
- Leakage as low as 5fA/V.
- Can be configured with up to 48 probes
- Probes can be configured in either single or dual layer
- Standard X/Y accuracy 10% pad size
- Standard Z accuracy +/- 5 microns