Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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- Optimized for DC parametric test and WLR
- Temperature compensated for use from -65°C to 300°C
- fA/V level leakage measurements
- Compatible with quick disconnect Celadon triax cable harnesses
- Quasi-Kelvin connections available
- Several Connector options available
If interested in a fully-integrated high-throughput test cell for wafer-level reliability (WLR), the Cascade Microtech ESTRADA system using Celadon probe cards may be a good fit for your testing needs.” Click here to learn more.