The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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- 300 millimeter ceramic button probe card
- Optimized for multi-site WLR
- For use with the Celadon Modular Adapter™
- Temperature compensated for use from -65°C to 350°C (options to 400°C)
- fA level leakage measurements
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If interested in a fully-integrated high-throughput test cell for wafer-level reliability (WLR), the Cascade Microtech ESTRADA system using Celadon probe cards may be a good fit for your testing needs.” Click here to learn more.